Aging of the over-voltage protection elements caused by over-voltages
Само за регистроване кориснике
2002
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The aim of this work is examining the influence of the number of the activation-over-voltage pulses to the aging of over-voltage protection elements. Both non-linear (gas-filled surge arresters (GFSA), varistors, over-voltage diodes) and linear (capacitors-constituents of filters) over-voltage protection elements were tested. The instruments employed allow reliable measurements, 1000 consecutive activation were tested. The double-exponential current pulse (amplitude I-1(max) = 13 A, I-2(max) = 16 A, rise time T-1 = 8 mus, fall time T-2 = 20 mus) for non-linear elements and a double-exponential over-voltage pulse (rise time T-1 = 1.2 mus, fall time T-2 = 50 mus) of the amplitude U-1(max) = 320 V, U-2(max) = 480 V and U-3(max) = 640 V for capacitors were used. The experimental results show that the over-voltage diodes are the most reliable elements in view of characteristic modifications that are consequence of aging. However, it was observed that varistors, GFSA and capacitors undergo n...oticeable changes in characteristics. (C) 2002 Elsevier Science Ltd. All rights reserved.
Извор:
Microelectronics Reliability, 2002, 42, 12, 1959-1966
DOI: 10.1016/S0026-2714(02)00240-8
ISSN: 0026-2714
WoS: 000179954000016
Scopus: 2-s2.0-0036891218
Институција/група
Tehnološko-metalurški fakultetTY - JOUR AU - Osmokrovic, Predrag AU - Lončar, Boris B. AU - Stanković, Srboljub J. AU - Vasić, Aleksandra PY - 2002 UR - http://TechnoRep.tmf.bg.ac.rs/handle/123456789/5374 AB - The aim of this work is examining the influence of the number of the activation-over-voltage pulses to the aging of over-voltage protection elements. Both non-linear (gas-filled surge arresters (GFSA), varistors, over-voltage diodes) and linear (capacitors-constituents of filters) over-voltage protection elements were tested. The instruments employed allow reliable measurements, 1000 consecutive activation were tested. The double-exponential current pulse (amplitude I-1(max) = 13 A, I-2(max) = 16 A, rise time T-1 = 8 mus, fall time T-2 = 20 mus) for non-linear elements and a double-exponential over-voltage pulse (rise time T-1 = 1.2 mus, fall time T-2 = 50 mus) of the amplitude U-1(max) = 320 V, U-2(max) = 480 V and U-3(max) = 640 V for capacitors were used. The experimental results show that the over-voltage diodes are the most reliable elements in view of characteristic modifications that are consequence of aging. However, it was observed that varistors, GFSA and capacitors undergo noticeable changes in characteristics. (C) 2002 Elsevier Science Ltd. All rights reserved. T2 - Microelectronics Reliability T1 - Aging of the over-voltage protection elements caused by over-voltages EP - 1966 IS - 12 SP - 1959 VL - 42 DO - 10.1016/S0026-2714(02)00240-8 ER -
@article{ author = "Osmokrovic, Predrag and Lončar, Boris B. and Stanković, Srboljub J. and Vasić, Aleksandra", year = "2002", abstract = "The aim of this work is examining the influence of the number of the activation-over-voltage pulses to the aging of over-voltage protection elements. Both non-linear (gas-filled surge arresters (GFSA), varistors, over-voltage diodes) and linear (capacitors-constituents of filters) over-voltage protection elements were tested. The instruments employed allow reliable measurements, 1000 consecutive activation were tested. The double-exponential current pulse (amplitude I-1(max) = 13 A, I-2(max) = 16 A, rise time T-1 = 8 mus, fall time T-2 = 20 mus) for non-linear elements and a double-exponential over-voltage pulse (rise time T-1 = 1.2 mus, fall time T-2 = 50 mus) of the amplitude U-1(max) = 320 V, U-2(max) = 480 V and U-3(max) = 640 V for capacitors were used. The experimental results show that the over-voltage diodes are the most reliable elements in view of characteristic modifications that are consequence of aging. However, it was observed that varistors, GFSA and capacitors undergo noticeable changes in characteristics. (C) 2002 Elsevier Science Ltd. All rights reserved.", journal = "Microelectronics Reliability", title = "Aging of the over-voltage protection elements caused by over-voltages", pages = "1966-1959", number = "12", volume = "42", doi = "10.1016/S0026-2714(02)00240-8" }
Osmokrovic, P., Lončar, B. B., Stanković, S. J.,& Vasić, A.. (2002). Aging of the over-voltage protection elements caused by over-voltages. in Microelectronics Reliability, 42(12), 1959-1966. https://doi.org/10.1016/S0026-2714(02)00240-8
Osmokrovic P, Lončar BB, Stanković SJ, Vasić A. Aging of the over-voltage protection elements caused by over-voltages. in Microelectronics Reliability. 2002;42(12):1959-1966. doi:10.1016/S0026-2714(02)00240-8 .
Osmokrovic, Predrag, Lončar, Boris B., Stanković, Srboljub J., Vasić, Aleksandra, "Aging of the over-voltage protection elements caused by over-voltages" in Microelectronics Reliability, 42, no. 12 (2002):1959-1966, https://doi.org/10.1016/S0026-2714(02)00240-8 . .