Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique
Апстракт
Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.
Кључне речи:
Glancing Angle Deposition / XPS / AFM / Nickel thin filmИзвор:
Science of Sintering, 2016, 48, 1, 51-56Издавач:
- Međunarodni Institut za nauku o sinterovanju, Beograd
Финансирање / пројекти:
- Функционални, функционализовани и усавршени нано материјали (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45005)
DOI: 10.2298/SOS1601051P
ISSN: 0350-820X
WoS: 000378175000005
Scopus: 2-s2.0-84965014439
Институција/група
Tehnološko-metalurški fakultetTY - JOUR AU - Potočnik, Jelena AU - Nenadović, Miloš AU - Jokić, Bojan M. AU - Popović, Maja AU - Rakočević, Zlatko Lj. PY - 2016 UR - http://TechnoRep.tmf.bg.ac.rs/handle/123456789/5836 AB - Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method. PB - Međunarodni Institut za nauku o sinterovanju, Beograd T2 - Science of Sintering T1 - Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique EP - 56 IS - 1 SP - 51 VL - 48 DO - 10.2298/SOS1601051P ER -
@article{ author = "Potočnik, Jelena and Nenadović, Miloš and Jokić, Bojan M. and Popović, Maja and Rakočević, Zlatko Lj.", year = "2016", abstract = "Zig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.", publisher = "Međunarodni Institut za nauku o sinterovanju, Beograd", journal = "Science of Sintering", title = "Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique", pages = "56-51", number = "1", volume = "48", doi = "10.2298/SOS1601051P" }
Potočnik, J., Nenadović, M., Jokić, B. M., Popović, M.,& Rakočević, Z. Lj.. (2016). Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique. in Science of Sintering Međunarodni Institut za nauku o sinterovanju, Beograd., 48(1), 51-56. https://doi.org/10.2298/SOS1601051P
Potočnik J, Nenadović M, Jokić BM, Popović M, Rakočević ZL. Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique. in Science of Sintering. 2016;48(1):51-56. doi:10.2298/SOS1601051P .
Potočnik, Jelena, Nenadović, Miloš, Jokić, Bojan M., Popović, Maja, Rakočević, Zlatko Lj., "Properties of Zig-Zag Nickel Nanostructures Obtained by GLAD Technique" in Science of Sintering, 48, no. 1 (2016):51-56, https://doi.org/10.2298/SOS1601051P . .