Thermal conductivity of nanoporous bismuth thin films
Samo za registrovane korisnike
2004
Autori
Song, David W.Shen, Weining-N.
Dunn, Bruce
Moore, Caroline D.
Goorsky, Mark S.
Radetić, Tamara
Gronsky, Ronald
Chen, Gang
Članak u časopisu (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
The thermal conductivity of nanoporous Bi thin films has been experimentally determined. Samples are fabricated by a liquid phase deposition, and their thermal conductivities are measured by a differential 3ω method. Nanoporous Bi thin films exhibit an order-of-magnitude reduction in thermal conductivity compared to that of solid films, most likely the result of a reduction in phonon mean free path. When porous Bi films are exposed to a hydrogen plasma, thermal conductivity measurements reveal no variation with extent of porosity, while electrical conductivity is much more sensitive to porosity, suggesting the possibility of independent control of these two intrinsic properties.
Izvor:
Applied Physics Letters, 2004, 84, 11, 1883-1885Izdavač:
- AIP Publishing
Finansiranje / projekti:
- DOD MURI program on thermoelectrics (ONR N00014-97-1-0516)
Institucija/grupa
Tehnološko-metalurški fakultetTY - JOUR AU - Song, David W. AU - Shen, Weining-N. AU - Dunn, Bruce AU - Moore, Caroline D. AU - Goorsky, Mark S. AU - Radetić, Tamara AU - Gronsky, Ronald AU - Chen, Gang PY - 2004 UR - http://TechnoRep.tmf.bg.ac.rs/handle/123456789/7283 AB - The thermal conductivity of nanoporous Bi thin films has been experimentally determined. Samples are fabricated by a liquid phase deposition, and their thermal conductivities are measured by a differential 3ω method. Nanoporous Bi thin films exhibit an order-of-magnitude reduction in thermal conductivity compared to that of solid films, most likely the result of a reduction in phonon mean free path. When porous Bi films are exposed to a hydrogen plasma, thermal conductivity measurements reveal no variation with extent of porosity, while electrical conductivity is much more sensitive to porosity, suggesting the possibility of independent control of these two intrinsic properties. PB - AIP Publishing T2 - Applied Physics Letters T1 - Thermal conductivity of nanoporous bismuth thin films EP - 1885 IS - 11 SP - 1883 VL - 84 DO - 10.1063/1.1682679 ER -
@article{ author = "Song, David W. and Shen, Weining-N. and Dunn, Bruce and Moore, Caroline D. and Goorsky, Mark S. and Radetić, Tamara and Gronsky, Ronald and Chen, Gang", year = "2004", abstract = "The thermal conductivity of nanoporous Bi thin films has been experimentally determined. Samples are fabricated by a liquid phase deposition, and their thermal conductivities are measured by a differential 3ω method. Nanoporous Bi thin films exhibit an order-of-magnitude reduction in thermal conductivity compared to that of solid films, most likely the result of a reduction in phonon mean free path. When porous Bi films are exposed to a hydrogen plasma, thermal conductivity measurements reveal no variation with extent of porosity, while electrical conductivity is much more sensitive to porosity, suggesting the possibility of independent control of these two intrinsic properties.", publisher = "AIP Publishing", journal = "Applied Physics Letters", title = "Thermal conductivity of nanoporous bismuth thin films", pages = "1885-1883", number = "11", volume = "84", doi = "10.1063/1.1682679" }
Song, D. W., Shen, Weining-N., Dunn, B., Moore, C. D., Goorsky, M. S., Radetić, T., Gronsky, R.,& Chen, G.. (2004). Thermal conductivity of nanoporous bismuth thin films. in Applied Physics Letters AIP Publishing., 84(11), 1883-1885. https://doi.org/10.1063/1.1682679
Song DW, Shen W, Dunn B, Moore CD, Goorsky MS, Radetić T, Gronsky R, Chen G. Thermal conductivity of nanoporous bismuth thin films. in Applied Physics Letters. 2004;84(11):1883-1885. doi:10.1063/1.1682679 .
Song, David W., Shen, Weining-N., Dunn, Bruce, Moore, Caroline D., Goorsky, Mark S., Radetić, Tamara, Gronsky, Ronald, Chen, Gang, "Thermal conductivity of nanoporous bismuth thin films" in Applied Physics Letters, 84, no. 11 (2004):1883-1885, https://doi.org/10.1063/1.1682679 . .