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Al-Zn Alloy Formation by Aluminium Underpotential Deposition from AlCl3+NaCl Melts on Zinc Substrate
dc.creator | Jovicević, Niko | |
dc.creator | Cvetković, Vesna S. | |
dc.creator | Kamberović, Željko | |
dc.creator | Jovicević, Jovan N. | |
dc.date.accessioned | 2021-03-10T11:42:08Z | |
dc.date.available | 2021-03-10T11:42:08Z | |
dc.date.issued | 2012 | |
dc.identifier.issn | 1452-3981 | |
dc.identifier.uri | http://TechnoRep.tmf.bg.ac.rs/handle/123456789/1999 | |
dc.description.abstract | Aluminium was incorporated into polycrystalline zinc electrode surface by underpotential deposition from equimolar AlCl3+NaCl melt at 473, 523 and 573 K. The process was studied by linear sweep voltammetry and potentiostatic deposition/galvanostatic striping. The deposits were characterised by glancing incidence X-ray diffraction (GIXRD), Auger (AES) and electron probe micro-analyzer (EPMA). The electrochemical measurements showed evidence of Zn - Al alloys being formed. The constant-potential regions measured during the low-current striping correspond to the coexistence of two pairs of metastable intermetallic phases. However, the observed alloys could not be identified. The growth kinetics of the compounds is described. | en |
dc.publisher | Electrochemical Science Group, Beograd | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Basic Research (BR or ON)/176020/RS// | |
dc.rights | restrictedAccess | |
dc.source | International Journal of Electrochemical Science | |
dc.subject | Underpotential deposition | en |
dc.subject | Aluminium-Zinc alloys | en |
dc.subject | Chloroaluminate melts | en |
dc.subject | Diffusion | en |
dc.subject | Growth kinetics | en |
dc.title | Al-Zn Alloy Formation by Aluminium Underpotential Deposition from AlCl3+NaCl Melts on Zinc Substrate | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 10393 | |
dc.citation.issue | 11 | |
dc.citation.other | 7(11): 10380-10393 | |
dc.citation.rank | M23 | |
dc.citation.spage | 10380 | |
dc.citation.volume | 7 | |
dc.identifier.pmid | ||
dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_technorep_1999 | |
dc.identifier.scopus | 2-s2.0-84871105098 | |
dc.identifier.wos | 000312934600003 | |
dc.type.version | publishedVersion |