Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique
Само за регистроване кориснике
2013
Аутори
Lazarević, Zorica Z.Kostić, S.
Radojević, Vesna
Romčević, Maja J.
Gilić, Martina
Petrović-Damjanović, M.
Romčević, Nebojša Ž.
Чланак у часопису (Објављена верзија)
Метаподаци
Приказ свих података о документуАпстракт
In this work, single crystals of bismuth silicon oxide (BSO; Bi12SiO20) have been grown by the Czochralski method. The growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12SiO20 has been investigated by x-ray diffraction (XRD), and Raman and Fourier transform infrared spectroscopy (FTIR) spectroscopy. The results obtained are discussed and compared with the published data. The pale yellow Bi12SiO20 single crystals prepared were without cores. Using spectroscopic measurements 19 Raman and 5 IR modes were observed.
Извор:
Physica Scripta, 2013, T157Издавач:
- IOP Publishing Ltd, Bristol
Финансирање / пројекти:
- Оптоелектронски нанодимензиони системи - пут ка примени (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45003)
DOI: 10.1088/0031-8949/2013/T157/014046
ISSN: 0031-8949
WoS: 000332504600047
Scopus: 2-s2.0-84891866285
Институција/група
Tehnološko-metalurški fakultetTY - JOUR AU - Lazarević, Zorica Z. AU - Kostić, S. AU - Radojević, Vesna AU - Romčević, Maja J. AU - Gilić, Martina AU - Petrović-Damjanović, M. AU - Romčević, Nebojša Ž. PY - 2013 UR - http://TechnoRep.tmf.bg.ac.rs/handle/123456789/2459 AB - In this work, single crystals of bismuth silicon oxide (BSO; Bi12SiO20) have been grown by the Czochralski method. The growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12SiO20 has been investigated by x-ray diffraction (XRD), and Raman and Fourier transform infrared spectroscopy (FTIR) spectroscopy. The results obtained are discussed and compared with the published data. The pale yellow Bi12SiO20 single crystals prepared were without cores. Using spectroscopic measurements 19 Raman and 5 IR modes were observed. PB - IOP Publishing Ltd, Bristol T2 - Physica Scripta T1 - Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique VL - T157 DO - 10.1088/0031-8949/2013/T157/014046 ER -
@article{ author = "Lazarević, Zorica Z. and Kostić, S. and Radojević, Vesna and Romčević, Maja J. and Gilić, Martina and Petrović-Damjanović, M. and Romčević, Nebojša Ž.", year = "2013", abstract = "In this work, single crystals of bismuth silicon oxide (BSO; Bi12SiO20) have been grown by the Czochralski method. The growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12SiO20 has been investigated by x-ray diffraction (XRD), and Raman and Fourier transform infrared spectroscopy (FTIR) spectroscopy. The results obtained are discussed and compared with the published data. The pale yellow Bi12SiO20 single crystals prepared were without cores. Using spectroscopic measurements 19 Raman and 5 IR modes were observed.", publisher = "IOP Publishing Ltd, Bristol", journal = "Physica Scripta", title = "Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique", volume = "T157", doi = "10.1088/0031-8949/2013/T157/014046" }
Lazarević, Z. Z., Kostić, S., Radojević, V., Romčević, M. J., Gilić, M., Petrović-Damjanović, M.,& Romčević, N. Ž.. (2013). Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique. in Physica Scripta IOP Publishing Ltd, Bristol., T157. https://doi.org/10.1088/0031-8949/2013/T157/014046
Lazarević ZZ, Kostić S, Radojević V, Romčević MJ, Gilić M, Petrović-Damjanović M, Romčević NŽ. Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique. in Physica Scripta. 2013;T157. doi:10.1088/0031-8949/2013/T157/014046 .
Lazarević, Zorica Z., Kostić, S., Radojević, Vesna, Romčević, Maja J., Gilić, Martina, Petrović-Damjanović, M., Romčević, Nebojša Ž., "Raman spectroscopy of bismuth silicon oxide single crystals grown by the Czochralski technique" in Physica Scripta, T157 (2013), https://doi.org/10.1088/0031-8949/2013/T157/014046 . .