Spectroscopy study of Bi12GeO20 single crystals
Samo za registrovane korisnike
2013
Autori
Lazarević, Zorica Z.Kostić, S.
Radojević, Vesna
Romčević, Maja J.
Hadžić, Branka
Trajić, Jelena
Romčević, Nebojša Ž.
Članak u časopisu (Objavljena verzija)
Metapodaci
Prikaz svih podataka o dokumentuApstrakt
In this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes.
Ključne reči:
Bi12GeO20 / Czochralski method / XRD / Raman spectroscopy / FTIRIzvor:
Optoelectronics and Advanced Materials-Rapid Communications, 2013, 7, 1-2, 58-61Izdavač:
- Natl Inst Optoelectronics, Bucharest-Magurele
Finansiranje / projekti:
- Optoelektronski nanodimenzioni sistemi - put ka primeni (RS-MESTD-Integrated and Interdisciplinary Research (IIR or III)-45003)
Institucija/grupa
Tehnološko-metalurški fakultetTY - JOUR AU - Lazarević, Zorica Z. AU - Kostić, S. AU - Radojević, Vesna AU - Romčević, Maja J. AU - Hadžić, Branka AU - Trajić, Jelena AU - Romčević, Nebojša Ž. PY - 2013 UR - http://TechnoRep.tmf.bg.ac.rs/handle/123456789/2549 AB - In this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes. PB - Natl Inst Optoelectronics, Bucharest-Magurele T2 - Optoelectronics and Advanced Materials-Rapid Communications T1 - Spectroscopy study of Bi12GeO20 single crystals EP - 61 IS - 1-2 SP - 58 VL - 7 UR - https://hdl.handle.net/21.15107/rcub_technorep_2549 ER -
@article{ author = "Lazarević, Zorica Z. and Kostić, S. and Radojević, Vesna and Romčević, Maja J. and Hadžić, Branka and Trajić, Jelena and Romčević, Nebojša Ž.", year = "2013", abstract = "In this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes.", publisher = "Natl Inst Optoelectronics, Bucharest-Magurele", journal = "Optoelectronics and Advanced Materials-Rapid Communications", title = "Spectroscopy study of Bi12GeO20 single crystals", pages = "61-58", number = "1-2", volume = "7", url = "https://hdl.handle.net/21.15107/rcub_technorep_2549" }
Lazarević, Z. Z., Kostić, S., Radojević, V., Romčević, M. J., Hadžić, B., Trajić, J.,& Romčević, N. Ž.. (2013). Spectroscopy study of Bi12GeO20 single crystals. in Optoelectronics and Advanced Materials-Rapid Communications Natl Inst Optoelectronics, Bucharest-Magurele., 7(1-2), 58-61. https://hdl.handle.net/21.15107/rcub_technorep_2549
Lazarević ZZ, Kostić S, Radojević V, Romčević MJ, Hadžić B, Trajić J, Romčević NŽ. Spectroscopy study of Bi12GeO20 single crystals. in Optoelectronics and Advanced Materials-Rapid Communications. 2013;7(1-2):58-61. https://hdl.handle.net/21.15107/rcub_technorep_2549 .
Lazarević, Zorica Z., Kostić, S., Radojević, Vesna, Romčević, Maja J., Hadžić, Branka, Trajić, Jelena, Romčević, Nebojša Ž., "Spectroscopy study of Bi12GeO20 single crystals" in Optoelectronics and Advanced Materials-Rapid Communications, 7, no. 1-2 (2013):58-61, https://hdl.handle.net/21.15107/rcub_technorep_2549 .