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dc.creatorLazarević, Zorica Z.
dc.creatorKostić, S.
dc.creatorRadojević, Vesna
dc.creatorRomčević, Maja J.
dc.creatorHadžić, Branka
dc.creatorTrajić, Jelena
dc.creatorRomčević, Nebojša Ž.
dc.date.accessioned2021-03-10T12:17:08Z
dc.date.available2021-03-10T12:17:08Z
dc.date.issued2013
dc.identifier.issn1842-6573
dc.identifier.urihttp://TechnoRep.tmf.bg.ac.rs/handle/123456789/2549
dc.description.abstractIn this work single crystals of bismuth germanium oxide (Bi12GeO20) have been grown by the Czochralski method. Growth conditions were studied. The critical diameter and the critical rate of rotation were calculated. Suitable polishing and etching solutions were determined. The structure of the Bi12GeO20 has been investigated by X-ray diffraction, Raman and FTIR spectroscopy. The obtained results are discussed and compared with published data. On the basis of the measurements by Raman spectroscopy, we observed 15 modes.en
dc.publisherNatl Inst Optoelectronics, Bucharest-Magurele
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45003/RS//
dc.rightsrestrictedAccess
dc.sourceOptoelectronics and Advanced Materials-Rapid Communications
dc.subjectBi12GeO20en
dc.subjectCzochralski methoden
dc.subjectXRDen
dc.subjectRaman spectroscopyen
dc.subjectFTIRen
dc.titleSpectroscopy study of Bi12GeO20 single crystalsen
dc.typearticle
dc.rights.licenseARR
dc.citation.epage61
dc.citation.issue1-2
dc.citation.other7(1-2): 58-61
dc.citation.rankM23
dc.citation.spage58
dc.citation.volume7
dc.identifier.rcubhttps://hdl.handle.net/21.15107/rcub_technorep_2549
dc.identifier.wos000316431400013
dc.type.versionpublishedVersion


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