Приказ основних података о документу
Raman spectroscopy study of anodic film on Ag43Cu37Zn20 alloy
dc.creator | Dimitrijević, Stevan | |
dc.creator | Lazarević, Zorica Z. | |
dc.creator | Rajčić-Vujasinović, Mirjana M. | |
dc.creator | Dimitrijević, Silvana | |
dc.creator | Petrović, M. | |
dc.creator | Gilić, Martina | |
dc.creator | Jokić, Bojan | |
dc.date.accessioned | 2021-03-10T13:06:10Z | |
dc.date.available | 2021-03-10T13:06:10Z | |
dc.date.issued | 2016 | |
dc.identifier.issn | 1842-6573 | |
dc.identifier.uri | http://TechnoRep.tmf.bg.ac.rs/handle/123456789/3314 | |
dc.description.abstract | The objective of this study was characterization of anodic film obtained when Ag43Cu37Zn20 alloy was treated electrochemically in 3.5% wt. NaCI under potentiostatic conditions. At the potential of +0.25 V a complex multilayer film is formed. XRD shows that it consists of CuCI and zinc hydroxichlorides with a small amount of Cu2O, probably formed in the film pores. The anodic film is a mixture of Cu2O, CuCI, Zn-5(OH)(8)center dot H2O and beta-Zn(OH)Cl. Phases of the alloy, Ag and Cu rich, show different anodic behavior. It was assumed that all phonon lines in the obtained Raman spectra were of the Lorentzian type, which is one of the common type of lines for this kind of analysis. Phases of Ag, CuCI, fl-Zn(OH)CI, Cu2O and Zn-5(OH)(8)(Cl)(2)center dot H2O were all registered by XRD. | en |
dc.publisher | Natl Inst Optoelectronics, Bucharest-Magurele | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45003/RS// | |
dc.relation | info:eu-repo/grantAgreement/MESTD/Technological Development (TD or TR)/34033/RS// | |
dc.rights | restrictedAccess | |
dc.source | Optoelectronics and Advanced Materials-Rapid Communications | |
dc.subject | Ag43Cu37Zn20 alloy | en |
dc.subject | Anodic film | en |
dc.subject | Brazing materials | en |
dc.subject | Raman spectroscopy | en |
dc.title | Raman spectroscopy study of anodic film on Ag43Cu37Zn20 alloy | en |
dc.type | article | |
dc.rights.license | ARR | |
dc.citation.epage | 780 | |
dc.citation.issue | 9-10 | |
dc.citation.other | 10(9-10): 777-780 | |
dc.citation.rank | M23 | |
dc.citation.spage | 777 | |
dc.citation.volume | 10 | |
dc.identifier.rcub | https://hdl.handle.net/21.15107/rcub_technorep_3314 | |
dc.identifier.scopus | 2-s2.0-85008707934 | |
dc.identifier.wos | 000389728800032 | |
dc.type.version | publishedVersion |