Приказ основних података о документу

dc.creatorPotočnik, Jelena
dc.creatorNenadović, Miloš
dc.creatorJokić, Bojan M.
dc.creatorPopović, Maja
dc.creatorRakočević, Zlatko Lj.
dc.date.accessioned2018-03-01T16:58:39Z
dc.date.accessioned2023-02-07T10:24:09Z
dc.date.available2018-03-01T16:58:39Z
dc.date.available2023-02-07T10:24:09Z
dc.date.issued2016
dc.identifier.issn0350-820X
dc.identifier.urihttp://TechnoRep.tmf.bg.ac.rs/handle/123456789/5836
dc.description.abstractZig-zag structure of the nickel thin film has been obtained using Glancing Angle Deposition (GLAD) technique. Glass substrate was positioned 75 degrees with respect to the substrate normal. The obtained nickel thin film was characterized by X-ray Photoelectron Spectroscopy, Scanning Electron Microscopy and Atomic Force Microscopy. Surface energy of the deposited thin film was determined by measuring the contact angle using the static sessile drop method.en
dc.publisherMeđunarodni Institut za nauku o sinterovanju, Beograd
dc.relationinfo:eu-repo/grantAgreement/MESTD/Integrated and Interdisciplinary Research (IIR or III)/45005/RS//
dc.rightsopenAccessen
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/
dc.sourceScience of Sinteringen
dc.subjectGlancing Angle Depositionen
dc.subjectXPSen
dc.subjectAFMen
dc.subjectNickel thin filmen
dc.titleProperties of Zig-Zag Nickel Nanostructures Obtained by GLAD Techniqueen
dc.typearticleen
dc.rights.licenseBY
dc.citation.epage56
dc.citation.issue1
dc.citation.rankM23
dc.citation.spage51
dc.citation.volume48
dc.identifier.doi10.2298/SOS1601051P
dc.identifier.fulltexthttp://TechnoRep.tmf.bg.ac.rs/bitstream/id/15431/1125.pdf
dc.identifier.scopus2-s2.0-84965014439
dc.identifier.wos000378175000005
dc.type.versionpublishedVersion


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Приказ основних података о документу